● Varies 4-point crown design enable“scrub”, for less soldermigration
● Jamming prevention
● Automatic thermal control
● Lean design with cost performance, Semi-Molded burn in socket
● Quick turn round for small volume engineering validation
● Capable for large scale BGA array.
● BGA QFN QFP Application
● High temperature: 155
Key reliability test which include HTOL/LTOL, HAST,HTSL,THB, etc
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Tel:86-0512-67069909
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